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Laser Scanning Microscope for Metrology
CSEM SA
CSEM is a privately held, R&D center established in 1984 in Neuchâtel, Switzerland. From the beginning, CSEM has been committed to both applied and order-related R&D. This bridge function between economics and science is still a core aspect of the company, and CSEM has continuously adapted its research areas to the needs of industry.
MedPhab partner
[TECHNICAL] DEVELOPMENT SUPPORT
Development Support
DEVELOPMENT SUPPORT [Characterization testing /services] Optical, electronics, mechanics
"[Characterization testing /services] Optical, electronics, mechanics"
in vitro diagnostics in vivo diagnostics therapeutics others
Technology provider Supplier Manufacturer Production services Integrator R&D Consultancy
The Keyence Laser Scanning Microscope (LSM) is a professional tool able to combine high quality imaging together with laser-based high-precision metrology. It can be used for several purpose alike characterization of optical surfaces, metrology and roughness investigations of cnc/laser-milled substrates, characterization of MEMS/MOEMS planarity and/or layer thicknesses and many other investigations too.
Microscope Type Keyence Laser Scanning Microscope (VKX-100)
Maximum size 100x100
Magnification 5X
Long working distance objectives available
Automated stage XY and Z yes
Software for stitching and metrology analysis yes
Software for comparing product batch results yes
The Keyence Laser Scanning Microscope (LSM) is a professional tool able to combine high quality imaging together with laser-based high-precision metrology. It can be used for several purpose alike characterization of optical surfaces, metrology/roughness investigations of cnc/laser-milled substrates
CSEM DS3 0008 V1.0
ISO 9001
N/A